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EN 61189-5-503-2017  Test methods for electrical materials, printed board and other interconnection structures and assemblies-Part 5-503:General test method for materials and assemblies-Conductive anodic filaments (CAF) testing of circuit boards EN 61189-5-503-2017  Test methods for electrical materials, printed board and other interconnection structures and assemblies-Part 5-503:General test method for materials and assemblies-Conductive anodic filaments (CAF) testing of circuit boards

EN 61189-5-503-2017 Test methods for electrical materials, printed board and other interconnection structures and assemblies-Part 5-503:General test method for materials and assemblies-Conductive anodic filaments (CAF) testing of circuit boards

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